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ARQUIVO DE ACRÔNIMOS: ABREVIATURAS

Como o número de ACRÔNIMOS ["palavra formada pela primeira letra (ou mais de uma) de cada uma das partes sucessivas de uma locução, ou pela maioria dessas partes"] que figura na literatura científica - especialmente na de Química -, cresce à cada dia, o WebSite LQES coloca à disposição o ARQUIVO DE ACRÔNIMOS LQES.

Várias fontes foram cotejadas (veja referências após a letra Z) para constituir a versão 1.0, que receberá acréscimos à medida em que novas informações forem coletadas e/ou recebidas.

Para consultar o significado de um determinado Acrônimo, bastar clicar na letra correspondente à sua inicial.

Caso você não encontre o significado do Acrônimo nesta lista, visite a rubrica LQES Cultural/Links Selecionados/Dicionários


Maria Isolete Alves, Managing Editor


A B C D E F G H I J K L M
N O P Q R S T U V W X Y Z



A  - voltar
AAS Atomic absorption spectroscopy
ACF Anisotropic conductive film
ADES Angle dispersed electron spectroscopy
AEM Analytical electron microscopy,
AES Auger electron spectroscopy
AES Atomic emission spectroscopy
AF Antiferromagnetic
AFM Atomic force microscopy
ALD Atomic layer deposition
ALE Atomic layer epitaxy
ALP Atomic layer processing
AME Angle-measuring equipment

AP

Atom probe (analyzer)
AP-CVD Atomic probe (analyzer); atomic property; annealing point; ammonium perchlorate
APS Appearance potential spectroscopy
AREM Atomic resolution electron microscopy
ARM Atomic resolution microscopy
ARP Angle resolved photoemission
ARPS Angle-resolved photoemission spectroscopy
ARUPS Angle-resolved ultraviolet photoelectron XPS
ARXPS Angle-resolved XPS
ASIC Application-specific integrated circuit


B  - voltar
b.c.c. Body-centered cubic
b.c.t. Body-centered tetragonal
BE Backscattered electron
BET Brunauer-Emmett-Teller
BF Bright field

BLE

Bombardment-induced light emission
BOD Biological oxygen demand
BOF Basic oxygen furnace
BOP Basic oxygen process
BPC Bonded phase chromatography

BSE

Backscattered electrons
BTE Boltzmann transport equation
BW Bandwidth

BZ

Brillouin zone


C  - voltar
CAIBE Chemically assisted ion beam etching
CARS

Coherent anti-stokes Raman scattering

CAS

Chemical Abstracts Service

CB

Conduction band

CBD

Convergent beam diffraction

CBE Chemical beam epitaxy

CBED

Convergent beam electron diffraction

CBIM Convergent-beam imaging microscopy
CC Cluster center

CCD

Charge-coupled device

c.c.p. Cubic close-packed
CD

Climb dislocation; compact disk; critical dimensions; circular dichroism; cross direction

CD-ROM Compact disk, read-only memory

CDW

Charge density wave

CE

Cluster expansion (technique); conductive elastomer; carbon equivalent; current efficiency

CEMS

Conversion electron Mössbauer spectroscopy

CHF Critical heat flux
CHM Chemical machining

CI

Chemical ionization

CIS Constant initial state spectroscopy
CIS Complex impedance spectroscopy
CITS Current imaging tunneling spectroscopy
Cl Cathodoluminescence
CMA Cylindrical mirror analyzer
CMC Ceramic matrix composites
CMOS Complementary metal-oxide semiconductor
CMR Contact microradiography
CMT Cadmium mercury telluride
COD Chemical oxygen demand; crack opening displacement
CPAA Charged particle activation analysis
CRT Cathode ray tube
CS Chemisorption
CSRS Coherent stokes Raman spectroscopy
CTE Coefficient of thermal expansion
CTEM Conventional transmission electron microscopy
CTEM Conventional TEM (=TEM)
CTF Contrast transfer function
CTL Charge transport layer
CV Capacitance-voltage; Charpy Vnotch; coefficient of variation
C-V Current-voltage
CVD Chemical vapour deposition
CVT Chemical vapor transport

CW

Continuous wave



D  - voltar
DAC Diamond anvil cell
DENS Diffuse elastic neutron scattering

DBM

Direct bombardment mod
DF Dark field
DFZ Defect-free zone
DLTS Deep-level transient spectroscopy
DME Dropping mercury electrode
DMS Desorption mass spectroscopy
DOF Depth of field
DOM Dissolved organic matter
DOC Density states
DQC Decagonal quasicrystal
DRAM Dynamic random access memory
DSA Dimensionally stable anode
DSC Differential scanning calorimetry
DTA Differential thermal analysis
DRX X-ray diffractometry

DXRD

Dynamic X-ray diffraction


E  - voltar
E-2E Electron coincidence spectroscopies

EB-PVD

Electron beam; extrudable

EB

Electron beam physical vapor deposition

EBIC

Electron beam induced conductivity

EB-PVD

Electron beam; extrudable
EBSP Electron backscattered spectroscopy
ECL Electrogenerated chemiluminescence
ECP Electron channeling pattern
ECR Electron cyclotron resonance
ED Electrodeposition
EDAX Energy dispersive X-ray analysis (Veja EDX)
EDC Energy-distribution curve
EDS Energy-dispersive X-ray spectrometry (Veja EDX)
EDX Energy-dispersive X-ray spectroscopy (Também EDS ou EDXS)
EELS Electron energy loss spectroscopy
EEM Emission electron microscopy
EEM Emission electron microscopy
EFM Electrical force microscopy
EG Electron gas; electrogalvanized; ethylene glycol
EHP Electron-hole pair
EI Electron impact
EID Electron-induced desorption
ELNES Energy-loss near-edge structure
ELS Electron energy loss spectroscopy
EM Emulsions; electromodulation
EMA Electron micropobe analysis; ethylene-methyl acrylate
EMAT Electromagnetic-acoustic transducer
EMF Electromotive force
EMI Electromagnetic interference
EMR Electromagnetic radiation
EOT Electrical oxide thickness
EPC Electropowder coating
EPMA Electron probe microanalysis

EPR

Electron paramagnetic resonance
ERS Enhanced Raman-spectroscopy
ESCA Electron spectroscopy for chemical analysis (Veja XPS)
ESD(MS) Electron stimulated desorption mass spectroscopy
ESR Electron spin resonance
EXAFS Extended (X-ray) absorption fine structure

EXELFS

Extended (electron) energy loss fine structure


F  - voltar
FAB Fast atom bombardment

FAB(MS)

Fast atom bombardment mass spectroscopy
f.c.c. Face-centered cubic
FCG

Fatigue crack growth

FCP Fatigue crack propagation
f.c.t. Face-centered tetragonal
FDMS Field desorption mass spectroscopy
FED Field emission device
FEED Field emission energy distributions
FEG Field emission gun
FEM Field emission microscopy
FES Field-effect spectroscopy
FG Fiberglass
FIM Field ion microscopy
FIMS Field ionization mass spectroscopy
FLn Fully lamellar, narrow (spacing)
FLw Fully lamellar, wide (spacing)
FM Ferromagnetic
FMCW Frequency-modulated continuous wave
FOM Figure of merit
FT Phase transformation
FTICR Fourier transform ion cyclotron resonance (Também FTMS)
FTIR Fourier transform infrared spectroscopy

FTMS

Fourier transform mass spectrometer (Também FTICR)

FWHM

Full width at half maximum


G  - voltar

GA

Gas atomization

GB

(gain) x (band-width) (product); grain boundary
GDMS Glow discharge mass spectroscopy

GLC

Gas-liquid chromatography

GMR

Giant magnetoresistance
GPC Gel permeation chromatography

GR

Graphite
GS Ground state
GSC Gas solid chromatography

GSMBE

Gas source MBE


H  - voltar
HBT Hetero-junction bipolar transistor
HDP

High-density plasma

HEED

High-energy electron diffraction

HEIS High energy ion scattering (Veja RBS)
HEL High-energy laser
HEM

Heat exchange method

HLW

High-level (radioactive) waste

HMW

High molecular weight

HOMO

Highest occupied molecular orbital

HOMO-LUMO

Highest occupied molecular orbital- lowest unoccupied molecular orbital

HOLZ

Higher order laue zone
HPHT High-pressure/high-temperature (technique)

HPLC

High-pressure liquid chromatography

HPMV

High-pressure mercury vapor (lamp)

HREM

High-resolution electron microscopy
HPT Heterojunction phototransistor

HRELS

High-resolution energy-loss spectroscopy

HRS

High-resolution spectrometer

HRSEM

High-resolution SEM

HRTEM

High-resolution TEM

HSA Hemispherical analyzer
HSLC High-speed liquid chromatography

HTS

High-temperature sputtering; high temperature
superconductor

HTSEC

High-temperature size-exclusion chromatography

HV

High vacuum (valve)

HVEM

High voltage electron microscopy


I  - voltar
IAES Ion induced Auger electron spectroscopy
I/O Input/output

IBAD

Ion-beam-assisted deposition

IBAE

Ion-beam-assisted etching

IBSD

Ion beam sputter deposition

IC

Integrated circuit

ICP

Inductively coupled plasma

ICPMS

Inductively coupled plasma mass spectroscopy
IDOS Integrated density of states

IE

Imaging ellipsometry

IETS Inelastic electron tunneling spectroscopy
IGFET Insulated-gate field-effect transistor

IILE

Ion-induced light emission

IMP(A)

Ion microprobe analysis
INS Ion neutralization spectroscopy
IPE Inverse photo emission
IPL Ion projection lithography
IPS Inverse photoemission
IQC Icosahedral quasicrystal

IR

Induced radioactivity; infrared

IRED

Infrared emitting diode

ISS Ion scattering spectroscopy
IUPAC International union for pure and applied chemistry
IV

Intermediate valence

I-V

Current (I)-voltage(V)



J  - voltar
JT Jahn-Teller


k  - voltar
KMC Kinetic Monte Carlo (simulations)
Kossel Diffraction of electron-excited X-rays


L  - voltar
L Langmuir (unit of gas dose)
LACVD

Laser-assisted CVD

LALLS

Low-angle laser-light scattering

LAMMA Laser microprobe mass analysis

LAXS

Low angle X-ray scattering
LC Liquid chromatography
LCAO

Linear combination of atomic orbitals

LCD

Liquid crystal display

LDMS

Laser desorption mass spectroscopy
LDOS Local density of states
LED

Light-emitting diode

LEED Low energy electron diffraction
LEELS Low energy electron loss spectroscopy
LEEM Low energy electron microscopy
LEIS Low energy ion (back) scattering
LET Linear energy transfer
LFM

Lateral force microscopy

LIMA Laser induced ion mass analysis
LIMS Laser ionization mass spectroscopy
LLC Liquid-liquid chromatography
LLW

Low-level (radioactive) waste

LMW

Low molecular weight

LNG

Liquefied natural gas

LNT

Liquid nitrogen temperature

LOX

Liquid oxygen

LPCVD

Low-pressure chemical vapor deposition

LPG

Liquefied petroleum gas

LPS Laser plasma source
LSC Liquid-solid chromatography
LVM

Local vibration mode



M  - voltar
MBE Molecular beam epitaxy
MBMS Molecular beam mass spectroscopy
MCD

Magnetic circular dichroism

MCVD

Modified chemical vapor deposition

ME

Microellipsometry

MFM

Magnetic force microscopy

MIM

Metal-isolator-metal

MIR-IR

Multiple internal reflectance infrared spectroscopy

ML

Monolayer; mega-Langmuir

MLC

Multilayer capacitor; multilayer ceramic

MMC

Metal matrix composites

MMR

Magnetically modulated microwave reflection
MOCVD Metallorganic chemical vapor deposition
MOD Metallorganic decomposition
MOLE

Molecular optical laser examiner

MO-MBE Metallo-organic MBE
MOS

Metal-oxide-semiconductor

MOSFET

Metal-oxide-semiconductor field effect transistor

MQW

Multiple quantum well

MR

Magnetoresistance

MS Mass spectroscopy
MSANS Multiple small angle neutron scattering

MULSAM

Multispectral auger microscope
MW Molecular weight
MWCVD

Microwave-plasma CVD

MXPS

Monochromatized x-ray photoelectron spectroscopy



N  - voltar
NAA Neutron activation analysis

NCEM

National Center for Electron Microscopy (Berkeley, CA)
ND Neutron diffraction
NDT Non-destructive testing
NHE Normal hydrogen electrode
NI Nanoindentation
NIS Neutron inelastic scattering
NIST National Institute of Standards and Technology (Antes: National Bureau of Standards)
NLO Nonlinear optical
NMR Nuclear Magnetic Resonance
NQR Nuclear quadrupole resonance spectroscopy
NSOM Near-field scanning optical microscopy
NTM Non-transition metal


O  - voltar
OB Occupied band
OE

Optical emission

OEIC

Opto-electronic integrated circuit

OLED

Organic light-emitting diode

OM Optical microscopy
OMVPE

Organometallic vapor-phase epitaxy



P  - voltar
PA Plasma arc
PACE Plasma-assisted chemical etching
PACVD Plasma-assisted CVD
PAM Photo acoustic microscopy
PAS Photoacoustic spectroscopy; positron annihilation spectroscopy
PBG

Photonic band gap

PC

Photonic crystal; polycarbonate

PCM

Phase change material; point-charge model

PCVD

Plasma-assisted chemical vapor deposition

PD

Phase diagram; photodetector; plasma doping

PDA

Photodiode array

PDOS Phonon density of states

PDS

Photothermal deflection spectroscopy
PECVD Plasma-enhance CVD
PEEM Photo emission electron microscopy
PEM Plastic encapsulated microcircuit
PES Photoelectron spectroscopy
PESM Photo electron spectro microscopy
PET Positron emission tomagraphy; pentaerythritol; poly(ethylene terephthalato)
PEYS Photo electron yield spectroscopy
PGC Pirolysis gas chromatography
PIXE Particle induced X-ray emission
PL Photolominescence
PLAD Pulsed laser ablation deposition
PLD Pulsed laser deposition
PLZT Lead lanthanum zirconate titanate
PMR Proton magnetic resonance
PMT Photomultiplier tube; polymethylpentene
PN Periodic number
PODSA Position sensitive atom probe
ppm Parts per million
PSD Position sensitive detector
PSD(MS) Photon stimulated desorption mass spectroscopy
PSZ Partially stabilized zirconia

PTCR

Positive temperature coefficient for resistance

PVD

Physical vapour deposition


Q  - voltar
QC Quasicrystalline; quasicrystal
QD

Quatum dot

QENS

Quasielastic neutron scattering

QMS

Quadrupole mass spectroscopy

QN

Quantum number

QW

Quantum well



R  - voltar
RAE Resistive anode encoder
RAM Random-access memory
RAP Reactive atmosphere processing

RBS

Rutherford backscattering spectroscopy (Também HEIS)
RCE Rotating compensator ellipsometer
RDF

Radial distribution function

RDS

Rate determining step; reflection difference spectroscopy

RED Reflection electron diffraction
REM Reflection electron microscopy
REMPI Resonantly-enhanced multi-photon ionization
REP Rotating electrode process
RF

Radiofrequency

RGA

Residual gas analyzer

RH

Relative humidity

RHE

Reversible hydrogen electrode

RHEED Reflection high energy electron diffraction
RIE Reactive ion etching
RIR Reference intensity ratios
RMS Root mean square

RSF

Relative sensitivity factor
RT Time real; room temperature
RTA

Rapid thermal annealing

RTE

Real time ellipsometry

RTP

Rapid thermal processing

RTPCVD

Rapid thermal processing CVD



S  - voltar
SACP Selected area channeling pattern

SAD

Selected area diffraction
SALI Surface analysis by laser ionization
SAM Scanning Auger microscopy
SANS Small angle neutron scattering
SAXS Small angle X-ray scattering
SBM Separate bombardment mode
SE Secondary electron
SEAM Scanning electron acoustic microscopy
SEM Scanning electron microscopy
SERS Surface enhanced Raman scattering
SEXAFS Surface EXAFS or Synchrotron EXAFS
SHEED Scanning high energy electron diffraction
SIIMS Secondary ion imaging mass spectroscopy
SIMS Secondary ion mass spectroscopy
SIPS Sputter induced photon spectroscopy
SLAM Scanning laser acoustic microscopy
SNMS Sputter neutral mass spectroscopy
SNOM Scanning nearfield optical microscopy
SOM Scanning optical microscopy
SOMSEM SOM in SEM
SPAM Scanning photo acoustic microscopy
STEM Scanning transmission electron microscopy
STM Scanning tunneling microscopy
STS Scanning tunneling spectroscopy
STXM Scanning transmission X-ray microscopy
SXE Soft X-ray emission

SXM

Scanning X-ray microscopy


T  - voltar
TCP Transmission channeling pattern

TD

Theoretical density
TEM Transmission electron microscopy
TGA Thermogravimetric analysis
TL Thermoluminescence
TMA Thermomechanical analysis
TMS Tetramethylsilane
TOF Time of flight
TRSS Time-resolved Raman spectroscopy

TXRF

Total reflection X-Ray fluorescence


U  - voltar
UPS Ultraviolet photoelectron spectroscopy

UTW

Ultra thin window (detector)


V  - voltar
VUV Vacuum ultraviolet


W  - voltar
WDS Veja WDX

WDX

Wavelength dispersive X-ray spectrometry (Também WDS)

WF

Work function


X  - voltar
XAFS X-ray absorption spectroscopy
XANES X-ray absorption near edge structure

XPS

X-ray photoelectron spectroscopy
XRD X-ray diffraction
XRF X-ray fluorescence

XRM

X-ray microscopy


Z  - voltar
ZAF Atomic number, absorption and fluorescence corrections pattern



Fontes:

  • W.S. Young, G.L. McVay and G.E. Pike (eds.), Ceramic Transactions, vol.5, Advanced Characterization Techniques for Ceramics, American Ceramic Society, Westerville, (1988).

  • P.J. Goodhew and J.E. Castle, Institute of Physics EMAG, 515, (1983).

  • P.E.J. Flewitt and R.K. Wild, "Physical Metods for Materials Chraracterisation", Institute of Physics Publishing, Bristol, (1994).

  • Bushow, K.H.J. et al., "Encyclopedia of Materials: Science and Technology", Elsevier Science Ltd., Oxford, (2001).

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