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NOVIDADES
Silicene consists of a single layer of silicon atoms. In contrast to the ultra-flat material graphene, which is made of carbon, silicene shows surface irregularities that influence its electronic properties. Now, physicists from the University of Basel have been able to precisely determine this corrugated structure. As they report in the journal PNAS ("Quantitative determination of atomic buckling of silicene by atomic force microscopy"), their method is also suitable for analyzing other two-dimensional materials. Since the experimental production of graphene, two-dimensional materials have been at the heart of materials research. Similar to carbon, a single layer of honeycombed atoms can be made from silicon. This material, known as silicene, has an atomic roughness, in contrast to graphene, since some atoms are at a higher level than others. A low-temperature atomic force microscope with a single carbon atom at the tip allows quantitative measurement of forces between sample and tip. Image: University of Basel, Department of Physics
The method developed by the researchers in Basel offers new insights into the world of two-dimensional materials and the relationship between structure and electronic properties. University of Surrey. Accessed: Jan 18, 2020.
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